| Home | All papers | Authors | Tags | Topics |
| 1995 | Tags | Topics | |
|---|---|---|---|
| Systematic Bias in OCR Experiments: A. Tomkins D. Lopresti J. Zhou Y. Chang : Proceedings of the IS&T/SPIE International Symposium on Electronic Imaging, L. M. Vincent and H. S. Baird, eds., February 1995, San Jose, CA, pp. 196-204. | OCR | ||