| Home | All papers | Authors | Tags | Topics |
| 1996 | Tags | Topics | |
|---|---|---|---|
| ps.gz | Validation of Image Defect Models for Optical Character Recognition.: A. Tomkins D. Lopresti G. Nagy Y. Li : IEEE Trans. Pattern Anal. Mach. Intell. 18(2): 99-108 (1996) | OCR | |
| 1995 | Tags | Topics | |
| Systematic Bias in OCR Experiments: A. Tomkins D. Lopresti J. Zhou Y. Chang : Proceedings of the IS&T/SPIE International Symposium on Electronic Imaging, L. M. Vincent and H. S. Baird, eds., February 1995, San Jose, CA, pp. 196-204. | OCR | ||